5. Denmark 2006-

I am presently Director of the Center for Electron Nanoscopy in the Technical University of Denmark in Lyngby, north of Copenhagen. The Center has been made possible by a donation from the A.P. Moller Foundation and was inaugurated in December 2007.

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4. Cambridge 2000-2007

For seven years, I was a Royal Society University Research Fellow in the Department of Materials Science and Metallurgy in the University of Cambridge, working primarily on off-axis electron holography of magnetic and electrostatic fields in nanostructured materials. For the final year of my fellowship, I worked in the UK and in Denmark.

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3. Oxford 1999-2000

For two years, after returning to the UK from Arizona, I was a Senior Research Officer in the Electron Microscopy and Microanalysis Group in the Department of Materials in the University of Oxford, where I was responsible for a newly-installed JEM-3000F field emission gun TEM.

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2. Arizona 1997-1998

For two years, I worked at the Center for Solid State Science at Arizona State University (ASU), where I was supervised by Dave Smith and Molly McCartney and sponsored by the IBM Almaden Research Center to work on the characterization of magnetic thin films and nanostructured magnetic elements.

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1. Cambridge 1987-1996

After completing my Ph.D. I worked for a further three years (1994-1996) in the Department of Materials Science and Metallurgy in the University of Cambridge, under the supervision of Michael Stobbs. This project involved assessing whether energy-filtered imaging, which had just become available using commercial spectrometers, allows phase and diffraction contrast images to be matched quantitatively to simulations.

On April 26 1996, Michael Stobbs, my research advisor, died at the age of 51.

My Ph.D. (1990-1994) was carried out in the Department of Materials Science and Metallurgy in the University of Cambridge, and sponsored by GEC-Marconi Ltd. My academic supervisor was Michael Stobbs and my industrial supervisor was Michael Kelly. This project involved the characterization of ultrathin doped layers in semiconductors using phase contrast techniques in the transmission electron microscope. In hindsight, this project was ahead of its time, and would have benefited from the more advanced sample preparation techniques that became available several years later.

As a physics undergraduate in Cambridge (1987-1990), I spent several summers working in the electron microscopy group in the Department of Materials Science and Metallurgy with Michael Stobbs and Simon Newcomb.

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